Today, cryo-electron microscopy (cryo-EM) can deliver incredible results in both structural and cell biology. Despite the great potential that this technique has widely demonstrated the major bottleneck, across the entire range of applications, is currently at the level of sample preparation.
When it comes to cellular cryo-EM, the use of Focused Ion Beam (FIB) milling is key to obtaining samples of suitable thickness. The utility of FIB today ranges from large volume imaging to cryo-lamella preparation of frozen-hydrated samples. I will present the latest advancements in automation for cryo-lamella preparation, demonstrating a high-throughput preparation, superior sample compatibility and increased ease of use. Further, I will demonstrate what can be achieved using an integrated correlative light and FIB/SEM setup and discuss the latest bottlenecks we identified in this field.
Alex de Marco
Bio available soon