The new Thermo Scientific Helios 5 Laser PFIB builds on the industry-leading Helios DualBeam family and incorporates the novel femto-second laser system for extremely fast material removal.
Through the combination of fs-Laser and PFIB, this new tool provides mm-scale subsurface and 3D analysis at nm resolution and enables new workflows such as fast characterization of air sensitive samples and multi-scale correlative microscopy with deep subsurface sample extraction. This instrument also offers all the capabilities of proven Helios 5 PFIB platform, including highest quality Ga-free TEM/APT sample preparation and extreme high-resolution imaging.
- Learn how Helios 5 Laser PFIB enables thousands times faster material removal compared to standard FIB-SEM or PFIB-SEM instruments, and at the same time, produces high quality cut face suitable for SEM imaging, or even EBSD mapping.
- See how Helios 5 Laser PFIB allows you to reveal nm-scale faults and failures embedded millimeters deep within your sample, much faster than with any other tool
- Discover how Helios 5 Laser PFIB with advanced automation and unique design enables automated overnight runs and unattended acquisition of mm-scale 3D volumes, freeing up the microscope for other uses during the day such as advanced TEM sample preparation or in situ experimentation.
Brandon Van Leer
Brandon Van Leer joined Thermo Fisher Scientific in late 2004 and has held various positions including Senior Applications Engineer, Applications Manager, and Product Marketing Manager. Currently, he is a Senior Applications & Business Development Manager for DualBeam and SEM instrumentation. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 20 years experience in various analytical techniques and over 15+ years exploring SEM and FIB and received his degrees from Oregon State University.